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Pushing the Limit of Fine-Tuning for Few-Shot Learning: Where Feature Reusing Meets Cross-Scale Attention

Ying-Yu Chen, Jun-Wei Hsieh, Xin Li, Ming-Ching Chang. Pushing the Limit of Fine-Tuning for Few-Shot Learning: Where Feature Reusing Meets Cross-Scale Attention. In Michael J. Wooldridge, Jennifer G. Dy, Sriraam Natarajan, editors, Thirty-Eigth AAAI Conference on Artificial Intelligence, AAAI 2024, Thirty-Sixth Conference on Innovative Applications of Artificial Intelligence, IAAI 2024, Fourteenth Symposium on Educational Advances in Artificial Intelligence, EAAI 2014, February 20-27, 2024, Vancouver, Canada. pages 11434-11442, AAAI Press, 2024. [doi]

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