Yaxi Chen, Ruimin Hu, Zheng Wang, Yuke Li. How to Face Unseen Defects? UDGAN for Improving Unseen Defects Recognition. In Elias Pimenidis, Plamen P. Angelov, Chrisina Jayne, Antonios Papaleonidas, Mehmet Aydin 0001, editors, Artificial Neural Networks and Machine Learning - ICANN 2022 - 31st International Conference on Artificial Neural Networks, Bristol, UK, September 6-9, 2022, Proceedings, Part I. Volume 13529 of Lecture Notes in Computer Science, pages 183-194, Springer, 2022. [doi]
Abstract is missing.