Haidong Chen, Zhaoling He, Jieyao Yang, Weijun Zhong, Haitian Zhou, Mengzhu Yan, Yi Wang, Jun Zhang, Weijie Lin, Linbo Chen, Ye Han, Wenquan Che, Jian Hu, Quan Xue. Advanced Multiprobe Dual-Polarized Arch System for Microwave Reflectance Measurement. IEEE T. Instrumentation and Measurement, 73:1-11, 2024. [doi]
Abstract is missing.