Yi Chen, Anil K. Jain. Beyond Minutiae: A Fingerprint Individuality Model with Pattern, Ridge and Pore Features. In Massimo Tistarelli, Mark S. Nixon, editors, Advances in Biometrics, Third International Conference, ICB 2009, Alghero, Italy, June 2-5, 2009. Proceedings. Volume 5558 of Lecture Notes in Computer Science, pages 523-533, Springer, 2009. [doi]
Abstract is missing.