A new method of generating synchronizable test sequences that detect output-shifting faults based on multiple UIO sequences - researchr publication authors

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Kai Chen, Fan Jiang, Chuan-dong Huang. A new method of generating synchronizable test sequences that detect output-shifting faults based on multiple UIO sequences. In Hisham Haddad, editor, Proceedings of the 2006 ACM Symposium on Applied Computing (SAC), Dijon, France, April 23-27, 2006. pages 1791-1797, ACM, 2006. [doi]

This author has not been identified. Look up 'Kai Chen' in GoogleThis author has not been identified. Look up 'Fan Jiang' in GoogleThis author has not been identified. Look up 'Chuan-dong Huang' in Google

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