Kai Chen, Fan Jiang, Chuan-dong Huang. A new method of generating synchronizable test sequences that detect output-shifting faults based on multiple UIO sequences. In Hisham Haddad, editor, Proceedings of the 2006 ACM Symposium on Applied Computing (SAC), Dijon, France, April 23-27, 2006. pages 1791-1797, ACM, 2006. [doi]
@inproceedings{ChenJH06:0,
title = {A new method of generating synchronizable test sequences that detect output-shifting faults based on multiple UIO sequences},
author = {Kai Chen and Fan Jiang and Chuan-dong Huang},
year = {2006},
doi = {10.1145/1141277.1141697},
url = {http://doi.acm.org/10.1145/1141277.1141697},
tags = {rule-based, synchronization, testing},
researchr = {https://researchr.org/publication/ChenJH06%3A0},
cites = {0},
citedby = {0},
pages = {1791-1797},
booktitle = {Proceedings of the 2006 ACM Symposium on Applied Computing (SAC), Dijon, France, April 23-27, 2006},
editor = {Hisham Haddad},
publisher = {ACM},
isbn = {1-59593-108-2},
}