Semi-Supervised Learning with Attention-Based CNN for Classification of Coffee Beans Defect - researchr publication authors

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Po-Han Chen, Sin-Ye Jhong, Chih-Hsien Hsia. Semi-Supervised Learning with Attention-Based CNN for Classification of Coffee Beans Defect. In IEEE International Conference on Consumer Electronics - Taiwan, ICCE-TW 2022, Taipei, Taiwan, July 6-8, 2022. pages 411-412, IEEE, 2022. [doi]

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