Po-Han Chen, Sin-Ye Jhong, Chih-Hsien Hsia. Semi-Supervised Learning with Attention-Based CNN for Classification of Coffee Beans Defect. In IEEE International Conference on Consumer Electronics - Taiwan, ICCE-TW 2022, Taipei, Taiwan, July 6-8, 2022. pages 411-412, IEEE, 2022. [doi]
@inproceedings{ChenJH22-0,
title = {Semi-Supervised Learning with Attention-Based CNN for Classification of Coffee Beans Defect},
author = {Po-Han Chen and Sin-Ye Jhong and Chih-Hsien Hsia},
year = {2022},
doi = {10.1109/ICCE-Taiwan55306.2022.9869187},
url = {https://doi.org/10.1109/ICCE-Taiwan55306.2022.9869187},
researchr = {https://researchr.org/publication/ChenJH22-0},
cites = {0},
citedby = {0},
pages = {411-412},
booktitle = {IEEE International Conference on Consumer Electronics - Taiwan, ICCE-TW 2022, Taipei, Taiwan, July 6-8, 2022},
publisher = {IEEE},
isbn = {978-1-6654-7050-6},
}