Yong Chen, Jionghua Jin, Jianjun Shi. Reliability modeling and analysis of multi-station manufacturing processes considering the quality and reliability interaction. In Proceedings of the IEEE International Conference on Systems, Man & Cybernetics: "e-Systems and e-Man for Cybernetics in Cyberspace", Tucson, Arizona, USA, 7-10 October 2001. pages 2093-2098, IEEE, 2001. [doi]
Abstract is missing.