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A Fast Open-Circuit and Short-Circuit Fault Diagnosis of AMB Amplifiers Driven by Switching States and Multi-Current-Sensor Data

Yihua Chen, Dong Jiang 0001, Yixuan Shuai, Mingqu Zhou, Jianfu Ding, Zicheng Liu 0007. A Fast Open-Circuit and Short-Circuit Fault Diagnosis of AMB Amplifiers Driven by Switching States and Multi-Current-Sensor Data. In 51st Annual Conference of the IEEE Industrial Electronics Society, IECON 2025, Madrid, Spain, October 14-17, 2025. pages 1-6, IEEE, 2025. [doi]

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