Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.
Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.
Shih-Hung Chen, Ming-Dou Ker. Active ESD protection circuit design against charged-device-model ESD event in CMOS integrated circuits. Microelectronics Reliability, 47(9-11):1502-1505, 2007. [doi]
Abstract is missing.