Wen-Yi Chen, Ming-Dou Ker, Yeh-Ning Jou, Yeh-Jen Huang, Geeng-Lih Lin. Improvement on ESD Robustness of Lateral DMOS in High-voltage CMOS ICs by Body Current Injection. In International Symposium on Circuits and Systems (ISCAS 2009), 24-17 May 2009, Taipei, Taiwan. pages 385-388, IEEE, 2009. [doi]
Abstract is missing.