On degree-sequence characterization and the extremal number of edges for various Hamiltonian properties under fault tolerance

Shih-Yan Chen, Shin-Shin Kao, Hsun Su. On degree-sequence characterization and the extremal number of edges for various Hamiltonian properties under fault tolerance. Discrete Mathematics & Theoretical Computer Science, 17(3):307-314, 2016. [doi]

Authors

Shih-Yan Chen

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Shin-Shin Kao

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Hsun Su

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