Shih-Yan Chen, Shin-Shin Kao, Hsun Su. On degree-sequence characterization and the extremal number of edges for various Hamiltonian properties under fault tolerance. Discrete Mathematics & Theoretical Computer Science, 17(3):307-314, 2016. [doi]
@article{ChenKS16-1,
title = {On degree-sequence characterization and the extremal number of edges for various Hamiltonian properties under fault tolerance},
author = {Shih-Yan Chen and Shin-Shin Kao and Hsun Su},
year = {2016},
url = {http://www.dmtcs.org/dmtcs-ojs/index.php/dmtcs/article/view/2776},
researchr = {https://researchr.org/publication/ChenKS16-1},
cites = {0},
citedby = {0},
journal = {Discrete Mathematics & Theoretical Computer Science},
volume = {17},
number = {3},
pages = {307-314},
}