A Fully Integrated GaN-on-Silicon Gate Driver and GaN Switch with Temperature-compensated Fast Turn-on Technique for Improving Reliability - researchr publication authors

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Hsuan-Yu Chen, Yu-Yung Kao, Zhi Qiang Zhang, Cheng-Hsiang Liao, Hong-Yuan Yang, Ming-Sheng Hsu, Ke-Horng Chen, Ying-Hsi Lin, Shian-Ru Lin, Tsung-Yen Tsai. A Fully Integrated GaN-on-Silicon Gate Driver and GaN Switch with Temperature-compensated Fast Turn-on Technique for Improving Reliability. In IEEE International Solid-State Circuits Conference, ISSCC 2021, San Francisco, CA, USA, February 13-22, 2021. pages 460-462, IEEE, 2021. [doi]

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