Yi-Jyun Chen, Yen-Han Lee, Ming-Chuan Chiu. Construct an Intelligent Yield Alert and Diagnostic Analysis System via Data Analysis: Empirical Study of a Semiconductor Foundry. In Ilkyeong Moon, Gyu M. Lee, Jinwoo Park, Dimitris Kiritsis, Gregor von Cieminski, editors, Advances in Production Management Systems. Smart Manufacturing for Industry 4.0 - IFIP WG 5.7 International Conference, APMS 2018, Seoul, Korea, August 26-30, 2018, Proceedings, Part II. Volume 536 of IFIP Advances in Information and Communication Technology, pages 394-401, Springer, 2018. [doi]
Abstract is missing.