ESD protection design for high-speed applications in CMOS technology

Jie-Ting Chen, Chun-Yu Lin, Rong-Kun Chang, Ming-Dou Ker, Tzu-Chien Tzeng, Tzu-Chiang Lin. ESD protection design for high-speed applications in CMOS technology. In IEEE 59th International Midwest Symposium on Circuits and Systems, MWSCAS 2016, Abu Dhabi, United Arab Emirates, October 16-19, 2016. pages 1-4, IEEE, 2016. [doi]

Abstract

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