Machine Learning-Based Approach to Analyze the Effect of Density of States on the Electrical Properties of a-IGZO TFT

Xiu-zhi Chen, Da Zheng Lin, Shih-Shin Hu, Hsin-Hui Hu, Yen-Lin Chen, Kun-Ming Chen. Machine Learning-Based Approach to Analyze the Effect of Density of States on the Electrical Properties of a-IGZO TFT. In IEEE International Conference on Consumer Electronics - Taiwan, ICCE-TW 2022, Taipei, Taiwan, July 6-8, 2022. pages 413-414, IEEE, 2022. [doi]

Authors

Xiu-zhi Chen

This author has not been identified. Look up 'Xiu-zhi Chen' in Google

Da Zheng Lin

This author has not been identified. Look up 'Da Zheng Lin' in Google

Shih-Shin Hu

This author has not been identified. Look up 'Shih-Shin Hu' in Google

Hsin-Hui Hu

This author has not been identified. Look up 'Hsin-Hui Hu' in Google

Yen-Lin Chen

This author has not been identified. Look up 'Yen-Lin Chen' in Google

Kun-Ming Chen

This author has not been identified. Look up 'Kun-Ming Chen' in Google