Xiu-zhi Chen, Da Zheng Lin, Shih-Shin Hu, Hsin-Hui Hu, Yen-Lin Chen, Kun-Ming Chen. Machine Learning-Based Approach to Analyze the Effect of Density of States on the Electrical Properties of a-IGZO TFT. In IEEE International Conference on Consumer Electronics - Taiwan, ICCE-TW 2022, Taipei, Taiwan, July 6-8, 2022. pages 413-414, IEEE, 2022. [doi]
Abstract is missing.