Xuanlong Chen, Liyuan Liu, Enliang Li. Metal defect localization of GaAs or Si based ICs by dynamic emission microscopy. Microelectronics Reliability, 72:24-29, 2017. [doi]
@article{ChenLL17-6,
title = {Metal defect localization of GaAs or Si based ICs by dynamic emission microscopy},
author = {Xuanlong Chen and Liyuan Liu and Enliang Li},
year = {2017},
doi = {10.1016/j.microrel.2017.03.003},
url = {https://doi.org/10.1016/j.microrel.2017.03.003},
researchr = {https://researchr.org/publication/ChenLL17-6},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {72},
pages = {24-29},
}