Xue Chen, Jiaqi Li, Yongxin Sui. A New Stitching Method for Dark-Field Surface Defects Inspection Based on Simplified Target-Tracking and Path Correction. Sensors, 20(2):448, 2020. [doi]
@article{ChenLS20-0,
title = {A New Stitching Method for Dark-Field Surface Defects Inspection Based on Simplified Target-Tracking and Path Correction},
author = {Xue Chen and Jiaqi Li and Yongxin Sui},
year = {2020},
doi = {10.3390/s20020448},
url = {https://doi.org/10.3390/s20020448},
researchr = {https://researchr.org/publication/ChenLS20-0},
cites = {0},
citedby = {0},
journal = {Sensors},
volume = {20},
number = {2},
pages = {448},
}