A New Stitching Method for Dark-Field Surface Defects Inspection Based on Simplified Target-Tracking and Path Correction

Xue Chen, Jiaqi Li, Yongxin Sui. A New Stitching Method for Dark-Field Surface Defects Inspection Based on Simplified Target-Tracking and Path Correction. Sensors, 20(2):448, 2020. [doi]

Abstract

Abstract is missing.