Jiale Chen, Duc Van Le, Rui Tan, Daren Ho. BubCam: A Vision System for Automated Quality Inspection at Manufacturing Lines. In Sayan Mitra, Nalini Venkatasubramanian, Abhishek Dubey, Lu Feng 0001, Mahsa Ghasemi, Jonathan Sprinkle, editors, Proceedings of the ACM/IEEE 14th International Conference on Cyber-Physical Systems, ICCPS 2023, (with CPS-IoT Week 2023), San Antonio, TX, USA, May 9-12, 2023. pages 12-21, ACM, 2023. [doi]
Abstract is missing.