Yield evaluation of analog placement with arbitrary capacitor ratio

Jwu-E Chen, Pei-Wen Luo, Chin-Long Wey. Yield evaluation of analog placement with arbitrary capacitor ratio. In 10th International Symposium on Quality of Electronic Design (ISQED 2009), 16-18 March 2009, San Jose, CA, USA. pages 179-184, IEEE, 2009. [doi]

Authors

Jwu-E Chen

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Pei-Wen Luo

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Chin-Long Wey

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