A Novel NBTI-Aware Chip Remaining Lifetime Prediction Framework Using Machine Learning

Yu-Guang Chen, Ing-Chao Lin, Yong-Che Wei. A Novel NBTI-Aware Chip Remaining Lifetime Prediction Framework Using Machine Learning. In 22nd International Symposium on Quality Electronic Design, ISQED 2021, Santa Clara, CA, USA, April 7-9, 2021. pages 476-481, IEEE, 2021. [doi]

Abstract

Abstract is missing.