An Interconnect Reliability-Driven Routing Technique for Electromigration Failure Avoidance

Xiaodao Chen, Chen Liao, Tongquan Wei, Shiyan Hu. An Interconnect Reliability-Driven Routing Technique for Electromigration Failure Avoidance. IEEE Trans. Dependable Sec. Comput., 9(5):770-776, 2012. [doi]

Abstract

Abstract is missing.