Haiyong Chen, Jiali Liu, Shuang Wang, Kun Liu 0009. Robust Dislocation Defects Region Segmentation for Polysilicon Wafer Image With Random Texture Background. IEEE Access, 7:134318-134329, 2019. [doi]
@article{ChenLWL19-1,
title = {Robust Dislocation Defects Region Segmentation for Polysilicon Wafer Image With Random Texture Background},
author = {Haiyong Chen and Jiali Liu and Shuang Wang and Kun Liu 0009},
year = {2019},
doi = {10.1109/ACCESS.2019.2942218},
url = {https://doi.org/10.1109/ACCESS.2019.2942218},
researchr = {https://researchr.org/publication/ChenLWL19-1},
cites = {0},
citedby = {0},
journal = {IEEE Access},
volume = {7},
pages = {134318-134329},
}