Robust Dislocation Defects Region Segmentation for Polysilicon Wafer Image With Random Texture Background - researchr publication references

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Haiyong Chen, Jiali Liu, Shuang Wang, Kun Liu 0009. Robust Dislocation Defects Region Segmentation for Polysilicon Wafer Image With Random Texture Background. IEEE Access, 7:134318-134329, 2019. [doi]

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