Chuen-Song Chen, Jien-Chung Lo, Tian Xia. Equivalent IDDQ Tests for Systems with Regulated Power Supply. In 21th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2006), 4-6 October 2006, Arlington, Virginia, USA. pages 291-299, IEEE Computer Society, 2006. [doi]
@inproceedings{ChenLX06,
title = {Equivalent IDDQ Tests for Systems with Regulated Power Supply},
author = {Chuen-Song Chen and Jien-Chung Lo and Tian Xia},
year = {2006},
doi = {10.1109/DFT.2006.28},
url = {http://doi.ieeecomputersociety.org/10.1109/DFT.2006.28},
tags = {testing},
researchr = {https://researchr.org/publication/ChenLX06},
cites = {0},
citedby = {0},
pages = {291-299},
booktitle = {21th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2006), 4-6 October 2006, Arlington, Virginia, USA},
publisher = {IEEE Computer Society},
isbn = {0-7695-2706-X},
}