Fan Chen, Duo Li, Yanbin Xu, Shuaifu Zhang, Qi Lv, Haojun Fan, Feng Dong 0001. A Preliminary Study on Excitation-Measurement Pattern in Planar Electrode Arrays on Detection of Crush-Induced Electrical Property Changes. IEEE T. Instrumentation and Measurement, 74:1-15, 2025. [doi]
Abstract is missing.