Learning Traces by Yourself: Blind Image Forgery Localization via Anomaly Detection With ViT-VAE

Tong Chen, Bin Li 0011, Jinhua Zeng. Learning Traces by Yourself: Blind Image Forgery Localization via Anomaly Detection With ViT-VAE. IEEE Signal Process. Lett., 30:150-154, 2023. [doi]

Abstract

Abstract is missing.