Tian Chen, Huaguo Liang, Minsheng Zhang, Wei Wang. A Scheme of Test Pattern Generation Based on Reseeding of Segment-Fixing Counter. In Proceedings of the 9th International Conference for Young Computer Scientists, ICYCS 2008, Zhang Jia Jie, Hunan, China, November 18-21, 2008. pages 2272-2277, IEEE Computer Society, 2008. [doi]
Abstract is missing.