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Mingsong Chen, Prabhat Mishra. Functional Test Generation Using Efficient Property Clustering and Learning Techniques. IEEE Trans. on CAD of Integrated Circuits and Systems, 29(3):396-404, 2010. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: Property Learning Techniques for Efficient Generation of Directed TestsMingsong Chen, Prabhat Mishra. TC, 60(6):852-864, 2011. [doi]
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