Jing Chen, Chunyan Ma, Zheng Chang. Fault Localization and Test Oracle Generation Based on the Mutual Pattern of Discrete Path Variables. In 21st IEEE International Conference on Software Quality, Reliability and Security, QRS 2021 - Companion, Hainan, China, December 6-10, 2021. pages 326-332, IEEE, 2021. [doi]
Abstract is missing.