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A Novel Diagnostic Method for Multiple Open-Circuit Faults of Voltage-Source Inverters Based on Output Line Voltage Residuals Analysis

Tao Chen, Yuedou Pan. A Novel Diagnostic Method for Multiple Open-Circuit Faults of Voltage-Source Inverters Based on Output Line Voltage Residuals Analysis. IEEE Trans. Circuits Syst. II Express Briefs, 68(4):1343-1347, 2021. [doi]

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