Evaluating and Optimizing Conventional Training Circuits for Analog Fault Diagnosis via Transfer Learning - researchr publication authors

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Yurong Chen, Kun Peng, Dan Huang, Qinglin Tang. Evaluating and Optimizing Conventional Training Circuits for Analog Fault Diagnosis via Transfer Learning. IEEE T. Instrumentation and Measurement, 74:1-15, 2025. [doi]

This author has not been identified. Look up 'Yurong Chen' in GoogleThis author has not been identified. Look up 'Kun Peng' in GoogleThis author has not been identified. Look up 'Dan Huang' in GoogleThis author has not been identified. Look up 'Qinglin Tang' in Google

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