Evaluating and Optimizing Conventional Training Circuits for Analog Fault Diagnosis via Transfer Learning

Yurong Chen, Kun Peng, Dan Huang, Qinglin Tang. Evaluating and Optimizing Conventional Training Circuits for Analog Fault Diagnosis via Transfer Learning. IEEE T. Instrumentation and Measurement, 74:1-15, 2025. [doi]

Abstract

Abstract is missing.