Min Chen, Vijay Reddy, Srikanth Krishnan, Jay Ondrusek, Yu Cao. ACE: A robust variability and aging sensor for high-k/metal gate SoC. In Proceedings of the European Solid-State Device Research Conference, ESSDERC 2013, Bucharest, Romania, September 16-20, 2013. pages 182-185, IEEE, 2013. [doi]
@inproceedings{ChenRKOC13,
title = {ACE: A robust variability and aging sensor for high-k/metal gate SoC},
author = {Min Chen and Vijay Reddy and Srikanth Krishnan and Jay Ondrusek and Yu Cao},
year = {2013},
doi = {10.1109/ESSDERC.2013.6818849},
url = {http://dx.doi.org/10.1109/ESSDERC.2013.6818849},
researchr = {https://researchr.org/publication/ChenRKOC13},
cites = {0},
citedby = {0},
pages = {182-185},
booktitle = {Proceedings of the European Solid-State Device Research Conference, ESSDERC 2013, Bucharest, Romania, September 16-20, 2013},
publisher = {IEEE},
}