Min Chen, Vijay Reddy, Srikanth Krishnan, Jay Ondrusek, Yu Cao. ACE: A robust variability and aging sensor for high-k/metal gate SoC. In Proceedings of the European Solid-State Device Research Conference, ESSDERC 2013, Bucharest, Romania, September 16-20, 2013. pages 182-185, IEEE, 2013. [doi]
Abstract is missing.