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Learning to Correct Sloppy Annotations in Electron Microscopy Volumes

Minghao Chen, Mukesh Bangalore Renuka, Lu Mi, Jeff Lichtman, Nir Shavit, Yaron Meirovitch. Learning to Correct Sloppy Annotations in Electron Microscopy Volumes. In IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR 2023 - Workshops, Vancouver, BC, Canada, June 17-24, 2023. pages 4273-4284, IEEE, 2023. [doi]

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