Minghao Chen, Mukesh Bangalore Renuka, Lu Mi, Jeff Lichtman, Nir Shavit, Yaron Meirovitch. Learning to Correct Sloppy Annotations in Electron Microscopy Volumes. In IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR 2023 - Workshops, Vancouver, BC, Canada, June 17-24, 2023. pages 4273-4284, IEEE, 2023. [doi]
Abstract is missing.