Ihao Chen, Andrzej J. Strojwas. A Methodology for Optimal Test Structure Design for Statistical Process Characterization and Diagnosis. IEEE Trans. on CAD of Integrated Circuits and Systems, 6(4):592-600, 1987. [doi]
@article{ChenS87:0,
title = {A Methodology for Optimal Test Structure Design for Statistical Process Characterization and Diagnosis},
author = {Ihao Chen and Andrzej J. Strojwas},
year = {1987},
url = {http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=28442&arnumber=1270307&count=17&index=10},
tags = {testing, design},
researchr = {https://researchr.org/publication/ChenS87%3A0},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
volume = {6},
number = {4},
pages = {592-600},
}