Jieshan Chen, Jiamou Sun, Sidong Feng, Zhenchang Xing, Qinghua Lu 0001, Xiwei Xu 0001, Chunyang Chen. Unveiling the Tricks: Automated Detection of Dark Patterns in Mobile Applications. In Sean Follmer, Jeff Han, Jürgen Steimle, Nathalie Henry Riche, editors, Proceedings of the 36th Annual ACM Symposium on User Interface Software and Technology, UIST 2023, San Francisco, CA, USA, 29 October 2023- 1 November 2023. ACM, 2023. [doi]
Abstract is missing.