SOM-Optimized Neurofuzzy Classifiers for Measuring Expatriation Willingness

Jieh-Haur Chen, Mu-Chun Su, Shang-I Lin, De-Yuan Huang. SOM-Optimized Neurofuzzy Classifiers for Measuring Expatriation Willingness. IEEE Intelligent Systems, 32(5):28-34, 2017. [doi]

Authors

Jieh-Haur Chen

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Mu-Chun Su

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Shang-I Lin

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De-Yuan Huang

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