Jieh-Haur Chen, Mu-Chun Su, Shang-I Lin, De-Yuan Huang. SOM-Optimized Neurofuzzy Classifiers for Measuring Expatriation Willingness. IEEE Intelligent Systems, 32(5):28-34, 2017. [doi]
@article{ChenSLH17,
title = {SOM-Optimized Neurofuzzy Classifiers for Measuring Expatriation Willingness},
author = {Jieh-Haur Chen and Mu-Chun Su and Shang-I Lin and De-Yuan Huang},
year = {2017},
doi = {10.1109/MIS.2017.3711643},
url = {http://doi.ieeecomputersociety.org/10.1109/MIS.2017.3711643},
researchr = {https://researchr.org/publication/ChenSLH17},
cites = {0},
citedby = {0},
journal = {IEEE Intelligent Systems},
volume = {32},
number = {5},
pages = {28-34},
}