Pattern based runtime voltage emergency prediction: An instruction-aware block sparse compressed sensing approach

Yu-Guang Chen, Michihiro Shintani, Takashi Sato, Yiyu Shi, Shih-Chieh Chang. Pattern based runtime voltage emergency prediction: An instruction-aware block sparse compressed sensing approach. In 22nd Asia and South Pacific Design Automation Conference, ASP-DAC 2017, Chiba, Japan, January 16-19, 2017. pages 543-548, IEEE, 2017. [doi]

Authors

Yu-Guang Chen

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Michihiro Shintani

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Takashi Sato

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Yiyu Shi

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Shih-Chieh Chang

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