Pattern based runtime voltage emergency prediction: An instruction-aware block sparse compressed sensing approach

Yu-Guang Chen, Michihiro Shintani, Takashi Sato, Yiyu Shi, Shih-Chieh Chang. Pattern based runtime voltage emergency prediction: An instruction-aware block sparse compressed sensing approach. In 22nd Asia and South Pacific Design Automation Conference, ASP-DAC 2017, Chiba, Japan, January 16-19, 2017. pages 543-548, IEEE, 2017. [doi]

@inproceedings{ChenSSSC17,
  title = {Pattern based runtime voltage emergency prediction: An instruction-aware block sparse compressed sensing approach},
  author = {Yu-Guang Chen and Michihiro Shintani and Takashi Sato and Yiyu Shi and Shih-Chieh Chang},
  year = {2017},
  doi = {10.1109/ASPDAC.2017.7858380},
  url = {http://dx.doi.org/10.1109/ASPDAC.2017.7858380},
  researchr = {https://researchr.org/publication/ChenSSSC17},
  cites = {0},
  citedby = {0},
  pages = {543-548},
  booktitle = {22nd Asia and South Pacific Design Automation Conference, ASP-DAC 2017, Chiba, Japan, January 16-19, 2017},
  publisher = {IEEE},
  isbn = {978-1-5090-1558-0},
}