Zhikuan Chen, Yufeng Sun, Yuqing Xue. Reliability Analysis For Thin Film Thermocouple Thermal Oxidation Failure Based On Interlayer Diffusion. In 10th International Conference on Dependable Systems and Their Applications, DSA 2023, Tokyo, Japan, August 10-11, 2023. pages 565-574, IEEE, 2023. [doi]
Abstract is missing.