Zhen Chen, Sharad C. Seth, Dong Xiang, Bhargab B. Bhattacharya. A Unified Solution to Scan Test Volume, Time, and Power Minimization. In VLSI Design 2010: 23rd International Conference on VLSI Design, 9th International Conference on Embedded Systems, Bangalore, India, 3-7 January 2010. pages 9-14, IEEE, 2010. [doi]
@inproceedings{ChenSXB10,
title = {A Unified Solution to Scan Test Volume, Time, and Power Minimization},
author = {Zhen Chen and Sharad C. Seth and Dong Xiang and Bhargab B. Bhattacharya},
year = {2010},
doi = {10.1109/VLSI.Design.2010.44},
url = {http://doi.ieeecomputersociety.org/10.1109/VLSI.Design.2010.44},
tags = {testing, C++},
researchr = {https://researchr.org/publication/ChenSXB10},
cites = {0},
citedby = {0},
pages = {9-14},
booktitle = {VLSI Design 2010: 23rd International Conference on VLSI Design, 9th International Conference on Embedded Systems, Bangalore, India, 3-7 January 2010},
publisher = {IEEE},
isbn = {978-0-7695-3928-7},
}