Zhen Chen, Sharad C. Seth, Dong Xiang, Bhargab B. Bhattacharya. A Unified Solution to Scan Test Volume, Time, and Power Minimization. In VLSI Design 2010: 23rd International Conference on VLSI Design, 9th International Conference on Embedded Systems, Bangalore, India, 3-7 January 2010. pages 9-14, IEEE, 2010. [doi]
Abstract is missing.